Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode
نویسندگان
چکیده
Rare earth elements (REE) are widely used in advanced technology. Praseodymium (Pr), neodymium (Nd), samarium (Sm) and dysprosium (Dy) are used in high-power permanent magnets. Ytterbium (Yb), erbium (Er) and holmium (Ho) are used in lasers. Lanthanum (La), gadolinium (Gd), terbium (Tb), europium (Eu) and Yb are components of luminescent and fluorescent phosphors, used in fluorescent lamps, radar screens and plasma displays. REEs are also used in auto exhaust absorption catalysts and in hightechnology glasses. It is clear from these examples that REEs play a key role in many types of materials used in high-technology industries. However, the presence of other REEs as contaminants in the pure single-element material often impacts the functionality of the final product, so impurities in the REE oxide raw material must therefore be carefully controlled. Direct measurement of trace rare earth elements (REEs) in high-purity REE oxide using the Agilent 8800 Triple Quadrupole ICP-MS with MS/MS mode
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